Personal information
Verified email addresses
bangtk77@gmail.com
Electrical machines, PMSM
South Korea
Activities
Employment (1)
2022-02-07
to
present
(VEB Engineering Cell)
Employment
Source:
Tae-Kyoung Bang
Education and qualifications (1)
2016-03-01
to
2022-02-25
|
Ph.D.
(electrical engineering)
Education
Source:
Tae-Kyoung Bang
Works (36)
IEEE Transactions on Applied Superconductivity
2022
|
Journal article
EID:
2-s2.0-85131755190
Contributors:
Cho, H.-W.;
Bang, T.-K.;
Lee, J.-I.;
Shin, K.-H.;
Lee, H.-S.;
Hur, J.-S.;
Haran, K.S.
Source:
Tae-Kyoung Bang
via
Scopus - Elsevier
IEEE Transactions on Magnetics
2022
|
Journal article
EID:
2-s2.0-85123867974
Contributors:
Bang, T.-K.;
Shin, K.-H.;
Lee, J.-I.;
Lee, H.-K.;
Cho, H.-W.;
Choi, J.-Y.
Source:
Tae-Kyoung Bang
via
Scopus - Elsevier
Machines
2022-10
|
Journal article
|
Author
Contributors:
Young-Keun Lee;
Tae-Kyoung Bang;
Seong-Tae Jo;
YongJoo Kim;
Kyung-Hun Shin;
Jang-Young Choi
Source:
check_circle
Multidisciplinary Digital Publishing Institute
AIP Advances
2021
|
Journal article
EID:
2-s2.0-85101482861
Contributors:
Bang, T.-K.;
Shin, K.-H.;
Lee, J.-I.;
Woo, J.-H.;
Cho, H.-W.;
Choi, J.-Y.
Source:
Tae-Kyoung Bang
via
Scopus - Elsevier
AIP Advances
2021
|
Journal article
EID:
2-s2.0-85100497424
Contributors:
Shin, K.-H.;
Bang, T.-K.;
Choi, J.-Y.;
Cho, H.-W.;
Haran, K.S.
Source:
Tae-Kyoung Bang
via
Scopus - Elsevier
IEEE Transactions on Magnetics
2021
|
Journal article
EID:
2-s2.0-85099876891
Contributors:
Woo, J.-H.;
Bang, T.-K.;
Lee, H.-K.;
Kim, K.-H.;
Shin, S.-H.;
Choi, J.-Y.
Source:
Tae-Kyoung Bang
via
Scopus - Elsevier
IEEE Transactions on Magnetics
2021
|
Journal article
EID:
2-s2.0-85099760188
Contributors:
Lee, J.-I.;
Shin, K.-H.;
Seo, S.-W.;
Bang, T.-K.;
Shin, S.-H.;
Kim, K.-H.;
Bird, J.;
Choi, J.-Y.
Source:
Tae-Kyoung Bang
via
Scopus - Elsevier
Transactions of the Korean Institute of Electrical Engineers
2021
|
Journal article
EID:
2-s2.0-85102337886
Contributors:
Bang, T.-K.;
Lee, J.-I.;
Jang, G.-H.;
Oh, J.-M.;
Choi, J.-Y.;
Cho, H.-W.
Source:
Tae-Kyoung Bang
via
Scopus - Elsevier
Transactions of the Korean Institute of Electrical Engineers
2021
|
Journal article
EID:
2-s2.0-85102509377
Contributors:
Oh, J.M.;
Bang, T.-K.;
Shin, K.-H.;
Choi, J.-Y.;
Cho, H.-W.
Source:
Tae-Kyoung Bang
via
Scopus - Elsevier
Energies
2021-12
|
Journal article
|
Author
Contributors:
Young-Keun Lee;
Tae-Kyoung Bang;
Jeong-In Lee;
JongHyeon Woo;
Sung-Tae Jo;
Jang-Young Choi
Source:
check_circle
Multidisciplinary Digital Publishing Institute
grade
Preferred source
(of
2)
Processes
2021-10
|
Journal article
|
Author
Contributors:
Kyung-Hun Shin;
Tae-Kyoung Bang;
Kyong-Hwan Kim;
Keyyong Hong;
Jang-Young Choi
Source:
check_circle
Multidisciplinary Digital Publishing Institute
grade
Preferred source
(of
3)
Applied Sciences
2021-09
|
Journal article
|
Author
Contributors:
JongHyeon Woo;
Tae-Kyoung Bang;
Jeong-In Lee;
Hoon-Ki Lee;
Jang-Young Choi
Source:
check_circle
Multidisciplinary Digital Publishing Institute
grade
Preferred source
(of
2)
Electronics
2021-08
|
Journal article
|
Author
Contributors:
Hoon-Ki Lee;
Tae-Kyoung Bang;
Jeong-In Lee;
JongHyeon Woo;
Hyo-Seob Shin;
Ick-Jae Yoon;
Jang-Young Choi
Source:
check_circle
Multidisciplinary Digital Publishing Institute
grade
Preferred source
(of
2)
Applied Sciences
2021-08
|
Journal article
|
Author
Contributors:
Jeong-In Lee;
Tae-Kyoung Bang;
Hoon-Ki Lee;
JongHyeon Woo;
Junghyo Nah;
Jang-Young Choi
Source:
check_circle
Multidisciplinary Digital Publishing Institute
grade
Preferred source
(of
2)
Energies
2021-05
|
Journal article
|
Author
Contributors:
Jeong-In Lee;
Kyung-Hun Shin;
Tae-Kyoung Bang;
Keyyong Hong;
Kyong-Hwan Kim;
Jang-Young Choi
Source:
check_circle
Multidisciplinary Digital Publishing Institute
grade
Preferred source
(of
2)
Transactions of the Korean Institute of Electrical Engineers
2020
|
Journal article
EID:
2-s2.0-85081979749
Contributors:
Bang, T.-K.;
Jang, G.-H.;
Lee, J.-I.;
Gong, H.-U.;
Choi, J.-Y.;
Cho, H.-W.
Source:
Tae-Kyoung Bang
via
Scopus - Elsevier
AIP Advances
2020
|
Journal article
EID:
2-s2.0-85078366289
Contributors:
Shin, K.-H.;
Bang, T.-K.;
Seo, S.-W.;
Kim, C.-W.;
Choi, J.-Y.
Source:
Tae-Kyoung Bang
via
Scopus - Elsevier
Transactions of the Korean Institute of Electrical Engineers
2020
|
Journal article
EID:
2-s2.0-85082023358
Contributors:
Woo, J.-H.;
Seo, S.-W.;
Bang, T.-K.;
Choi, J.-Y.
Source:
Tae-Kyoung Bang
via
Scopus - Elsevier
IEEE Transactions on Applied Superconductivity
2020
|
Journal article
EID:
2-s2.0-85082839518
Contributors:
Shin, K.-H.;
Bang, T.-K.;
Cho, H.-W.;
Choi, J.-Y.
Source:
Tae-Kyoung Bang
via
Scopus - Elsevier
IEEE Transactions on Applied Superconductivity
2020
|
Journal article
EID:
2-s2.0-85081068590
Contributors:
Lee, J.-I.;
Shin, K.-H.;
Bang, T.-K.;
Ryu, D.-W.;
Kim, K.-H.;
Hong, K.;
Choi, J.-Y.
Source:
Tae-Kyoung Bang
via
Scopus - Elsevier
AIP Advances
2020
|
Journal article
EID:
2-s2.0-85078021271
Contributors:
Woo, J.-H.;
Bang, T.-K.;
Kim, C.-W.;
Yoon, I.-J.;
Choi, J.-Y.
Source:
Tae-Kyoung Bang
via
Scopus - Elsevier
IEEE Transactions on Applied Superconductivity
2020
|
Journal article
EID:
2-s2.0-85082168786
Contributors:
Lee, H.-K.;
Shin, K.-H.;
Bang, T.-K.;
Nah, J.-H.;
Choi, J.-Y.
Source:
Tae-Kyoung Bang
via
Scopus - Elsevier
IEEE Transactions on Applied Superconductivity
2020
|
Journal article
EID:
2-s2.0-85084928938
Contributors:
Woo, J.-H.;
Kim, C.-W.;
Bang, T.-K.;
Lee, S.-H.;
Lee, K.-S.;
Choi, J.-Y.
Source:
Tae-Kyoung Bang
via
Scopus - Elsevier
AIP Advances
2020
|
Journal article
EID:
2-s2.0-85077965362
Contributors:
Kwon, D.-Y.;
Bang, T.-K.;
Kim, C.-W.;
Shin, K.-H.;
Choi, J.-Y.
Source:
Tae-Kyoung Bang
via
Scopus - Elsevier
IEEE Transactions on Applied Superconductivity
2020
|
Journal article
EID:
2-s2.0-85083167973
Contributors:
Lee, J.-I.;
Shin, K.-H.;
Bang, T.-K.;
Choi, B.-S.;
Kim, B.-O.;
Choi, J.-Y.
Source:
Tae-Kyoung Bang
via
Scopus - Elsevier
AIP Advances
2020
|
Journal article
EID:
2-s2.0-85078822135
Contributors:
Seo, S.-W.;
Shin, K.-H.;
Jang, G.-H.;
Bang, T.-K.;
Choi, J.-Y.
Source:
Tae-Kyoung Bang
via
Scopus - Elsevier
Journal of Physics: Conference Series
2020
|
Conference paper
EID:
2-s2.0-85090030826
Contributors:
Oh, J.M.;
Bang, T.K.;
Jang, G.H.;
Lee, J.I.;
Haran, K.S.;
Cho, H.W.
Source:
Tae-Kyoung Bang
via
Scopus - Elsevier
Applied Sciences
2020-12
|
Journal article
|
Author
Contributors:
Tae-Kyoung Bang;
Kyung-Hun Shin;
Jeong-In Lee;
Hoon-Ki Lee;
Han-Wook Cho;
Jang-Young Choi
Source:
check_circle
Multidisciplinary Digital Publishing Institute
grade
Preferred source
(of
2)
Applied Sciences
2020-11
|
Journal article
|
Author
Contributors:
Hoon Ki Lee;
Tae-Kyoung Bang;
Jong Hyeon Woo;
Hyo Seob Shin;
Jang Young Choi
Source:
check_circle
Multidisciplinary Digital Publishing Institute
grade
Preferred source
(of
2)
International Journal of Innovative Technology and Exploring Engineering
2019
|
Journal article
EID:
2-s2.0-85068728559
Contributors:
Jang, G.-H.;
Seo, S.-W.;
Kim, C.-W.;
Shin, K.-H.;
Lee, J.-I.;
Bang, T.-K.;
Yoon, I.-J.;
Choi, J.-Y.
Source:
Tae-Kyoung Bang
via
Scopus - Elsevier
Transactions of the Korean Institute of Electrical Engineers
2019
|
Journal article
EID:
2-s2.0-85061524482
Contributors:
Lee, J.-I.;
Shin, K.-H.;
Bang, T.-K.;
Lee, S.-H.;
Choi, J.-Y.
Source:
Tae-Kyoung Bang
via
Scopus - Elsevier
IEEE Transactions on Magnetics
2019
|
Journal article
EID:
2-s2.0-85077491939
Contributors:
Shin, K.-H.;
Bang, T.-K.;
Cho, H.-W.;
Kim, K.-H.;
Hong, K.;
Choi, J.-Y.
Source:
Tae-Kyoung Bang
via
Scopus - Elsevier
AIP Advances
2019
|
Journal article
EID:
2-s2.0-85077733046
Contributors:
Lee, H.-K.;
Bang, T.-K.;
Lee, J.-I.;
Shin, K.-H.;
Choi, J.-Y.
Source:
Tae-Kyoung Bang
via
Scopus - Elsevier
AIP Advances
2019
|
Journal article
EID:
2-s2.0-85077311708
Contributors:
Lee, J.-I.;
Shin, K.-H.;
Jang, G.-H.;
Bang, T.-K.;
Ryu, D.-W.;
Choi, J.-Y.
Source:
Tae-Kyoung Bang
via
Scopus - Elsevier
International Journal of Engineering and Technology(UAE)
2018
|
Journal article
EID:
2-s2.0-85082350642
Contributors:
Bang, T.-K.;
Shin, K.-H.;
Lee, J.-I.;
Han, C.;
Cho, S.-K.;
Choi, J.-Y.
Source:
Tae-Kyoung Bang
via
Scopus - Elsevier
IEEE Transactions on Applied Superconductivity
2018
|
Journal article
EID:
2-s2.0-85038403575
Contributors:
Bang, T.-K.;
Shin, K.-H.;
Koo, M.-M.;
Han, C.;
Cho, H.-W.;
Choi, J.-Y.
Source:
Tae-Kyoung Bang
via
Scopus - Elsevier